VITA Technologies
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX
Menu
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX
  • Articles
  • White Papers
  • Products
  • News
Menu
  • Articles
  • White Papers
  • Products
  • News
  Industry News  Meet the Challenges of RoHS/WEEE Compliance
Industry News

Meet the Challenges of RoHS/WEEE Compliance

Fischer Technology, Inc.Fischer Technology, Inc.—November 15, 20070
FacebookTwitterPinterestLinkedInTumblrRedditVKWhatsAppEmail

More stories

Kernel – A Micro-Gateway Module from GAO

March 18, 2009

GE Intelligent Platforms Introduces High Performance Single Board Computer Featuring Intel’s Latest Processor for Optimum Performance/Watt

January 7, 2010

A new start for Plessey Semiconductors

January 10, 2010

Mercury Systems Launches Single Board Computer with 30x Faster Boot Time for Mission-Critical Avionics Applications

September 7, 2017

The Fischerscope XDV-SD is an X-ray fluorescence spectrometer that has been developed specifically for the challenges in connection with RoHS / WEEE analyses as well as the assay determination of gold and other precious metals. Extremely short measurement times are possible due to the high X-Ray intensity produced by an innovative digital pulse processor. Even small electronic components or coating systems on printed circuit conductors are analyzed with pinpoint precision.

Any shape samples and precious metal coatings can be analyzed for up to 24 different elements with regard to coating thickness and element concentration which can be determined simultaneously during one measurement. Very thin coatings down into the 10-nanometer range can be measured. A high resolution color video camera generates an exact view video image of the specimen from above that is true to scale. The XDV-SD can be automated for larger random sampling due to the programmable X, Y, and Z measurement stage.

Fischer has been an innovative leader in the field of non-destructive thickness measurement and material testing instruments since 1953. Solutions are available for coating thickness measurement using the X-Ray fluorescence, beta backscatter, magnetic induction, eddy current and coulometric methods. Fischer also offers solutions for measurement of micro-hardness, conductivity, ferrite content and porosity testing.

For more information contact Fischer Technology, Inc. 750 Marshall Phelps Road, Windsor, CT 06095 800-243-8417 E-mail: [email protected]. Web site: www.fischer-technology.com

FacebookTwitterPinterestLinkedInTumblrRedditVKWhatsAppEmail
Contela Chooses Ulticom to Deploy Wireless Office Solution
Fujitsu Introduces 10G Ethernet LAN-PHY Mapper for WDM Networks
Related posts
  • Related posts
  • More from author
Articles

The VITA Technologies 2025 Resource Guide is here!

June 19, 20250
Articles

Next-gen fiber optics for aviation: Expanded Beam performance with VITA 95/96

June 3, 20250
Articles

Embedded Tech Trends 2025 Wrapup

June 3, 20250
Load more
Read also
Articles

The VITA Technologies 2025 Resource Guide is here!

June 19, 20250
Articles

Next-gen fiber optics for aviation: Expanded Beam performance with VITA 95/96

June 3, 20250
Articles

Embedded Tech Trends 2025 Wrapup

June 3, 20250
Consortia and Working Groups

VITA standards activity updates

June 3, 20250
Articles

Leveraging AI in standards

June 3, 20250
Eletter Products

SPONSORED: SpaceVPX Solutions From Pixus Technologies

May 28, 20250
Load more

Recent Comments

No comments to show.
  • Articles
  • White Papers
  • Products
  • News
Menu
  • Articles
  • White Papers
  • Products
  • News
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX
Menu
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX

© 2023 VITA Technologies. All rights Reserved.