VITA Technologies
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX
Menu
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX
  • Articles
  • White Papers
  • Products
  • News
Menu
  • Articles
  • White Papers
  • Products
  • News
  Conferences and Awards  Thirty-Sixth Annual Measurement Science Conference Line-Up Announced
Conferences and Awards

Thirty-Sixth Annual Measurement Science Conference Line-Up Announced

Measurement Science ConferenceMeasurement Science Conference—October 25, 20050
FacebookTwitterPinterestLinkedInTumblrRedditVKWhatsAppEmail

Newport Beach, CA – October 25, 2005 – Measurement Science Conference (MSC) Chairman John Fishell announced today the schedule for the 36th Annual Conference, being held at the Disneyland Hotel, February 27-March 3, 2006.

“I am pleased to announce the 2006 MSC schedule and conference theme of The Science, Technology, and Control of Measurement. This stands to be our best and most informative conference to date,” said Fishell. “We’re expecting more attendees this year and have planned an exciting conference for them.”

One of the key features of the MSC Conference is the excellent quality of training available to attendees. “We are glad to announce that the National Institute of Standards and Technology (NIST) will once again be joining the Conference and leading two days of seminars,” said NIST Seminars/Tutorials Chairman Bob Fritzsche. “As one of the largest off-campus conferences NIST participates in, this is an outstanding opportunity for hands-on training with the global leader in measurement standards,” continued Fritzsche.

The Conference will also feature three special sessions dedicated to Recommended Practice (RP) and standard revisions that were discussed at the National Conference of Standards Laboratories International (NCSLi) Conference last August. Programs Chairman Mark Kaufman said, “The RPs being discussed for revision and feedback are RPs 1, and 12, and ANSI/NCSLi standard Z540. These sessions will be an excellent opportunity for participants to get the latest status and to provide their input on the recommended revisions.”

Already known for its valuable tutorials for technicians, the Conference is expecting this year’s anticipated increase in attendee registration to particularly benefit exhibitors. “Our technical program is especially strong this year, and based on the feedback we’ve received so far, we expect increased registration of attendees. This really benefits our exhibitors who will have the opportunity to market to even more people than before, not only the people who use their products, but those who buy their products,” said Fishell.

A number of leading companies and organizations in the test and measurement field have already seen this opportunity and will be at the Conference. “We have a strong line-up of exhibitors at the 2006 Conference, with major companies like Fluke, Agilent, Northrop Grumman, and the U.S. Navy,” said Exhibits Chairwoman Kara Harmon. “In addition to these established exhibitors, we strongly encourage first-time exhibitors to participate by taking advantage of our special discount offers, providing an opportunity to gain recognition at the Measurement Science Conference.”

”Last year, we celebrated our 35th anniversary conference and are looking forward to the next 35. We’ve made some exciting changes for the 2006 Conference to accommodate growth, and we’re looking forward to making additional enhancements in the coming months to make this the best conference ever,” said Fishell.

More stories

Chassis Plans Honored Fifth Time in SDBJ Fast 100 Fastest Growing Companies

July 23, 2012

SDC Systems to Exhibit New Embedded Technologies at Military and Aerospace Event

August 28, 2006

Actel Space Forums Blast off in Europe and Russia

April 7, 2009

The Latest Thinking in Electronics Enclosure Design to be explored at UK Conference

March 15, 2013

Further updates on the workshop schedule, NIST tutorial schedule, technical paper presentations, as well as the latest Conference updates, can all be found by logging on to the website at www.msc-conf.com or calling tollfree 1-866-672-6327.

Events Summary:

Monday-Tuesday, February 27-28, 2006

NIST Seminars

Wednesday, March 1, 2006

Tutorial Workshops

Exhibits

Thursday-Friday, March 2-3, 2006

Technical Paper Presentations

Exhibits

# # # # #

For more than 35 years, the Measurement Science Conference has been a leader in promoting education and professionalism in the measurement science disciplines. The annual conference attracts expert speakers, exhibitors, and attendees from around the world for the weeklong event focused on the dynamic measurement science field.

FacebookTwitterPinterestLinkedInTumblrRedditVKWhatsAppEmail
GE Fanuc Promotes VITA 56 Mezzanine Standard Working Group
ATEME Introduces High Performance MPEG-4 AVC/H.264 Encoder PC Suite
Related posts
  • Related posts
  • More from author
Eletter Products

SPONSORED: SpaceVPX Solutions From Pixus Technologies

May 28, 20250
Eletter Products

SPONSORED: Mission-Ready Chassis Management Aligned to SOSA®

May 28, 20250
Eletter Products

SPONSORED: 2300W Intelligent VPX Power Supply

May 21, 20250
Load more
Read also
Eletter Products

SPONSORED: SpaceVPX Solutions From Pixus Technologies

May 28, 20250
Eletter Products

SPONSORED: Mission-Ready Chassis Management Aligned to SOSA®

May 28, 20250
Eletter Products

SPONSORED: 2300W Intelligent VPX Power Supply

May 21, 20250
Eletter Products

SPONSORED: Small Scale 4 Slot OpenVPX and SOSA Aligned System Development

May 21, 20250
Eletter Products

SPONSORED: 3U VPX HD Switch Doubles Backplane Density

May 14, 20250
Eletter Products

SPONSORED: Rugged 1/2 ATR Aligned to SOSA, CMFF and SAVE Ready

January 30, 20250
Load more

Recent Comments

No comments to show.
  • Articles
  • White Papers
  • Products
  • News
Menu
  • Articles
  • White Papers
  • Products
  • News
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX
Menu
  • VME
  • XMC
  • FMC
  • PMC
  • VNX
  • VPX

© 2023 VITA Technologies. All rights Reserved.