Newport Beach, CA – December 7, 2005 – Measurement Science Conference (MSC) Programs Chairman Mark Kaufman announced today a strong line-up of sessions focusing on the challenges in the business of metrology and calibration. The challenges to managers and supervisors come mostly from technology or the need to improve business efficiency. More than a dozen technical sessions will cover the current state of metrology (national and international), standards and practices, corporate process changes and the impact on the lab, and how lab managers can meet the coming challenges. The 36th Annual Conference is being held at the Disneyland Hotel, February 27 – March 3, 2006. The technical program is on Thursday and Friday.
“In keeping with our 2006 conference theme of The Science, Technology, and Control of Measurement, we’ve organized a broad spectrum of presentations, spanning a couple different tracks, which are of particular interest to lab managers and supervisors,” said Kaufman. “MSC has always been an educational conference; the program has always focused on exchanging information. These presentations will provide valuable insight in the future of the field.”
One of the key sessions, entitled Metrology: the Next 20 Years, will discuss the struggle between the obvious benefits of calibration, its overhead expense, and the market forces to drive that expense down. “Advances in technology and business environments will bring about these challenges, and challenges always bring about changes in the ways we do business,” said session developer Chet Franklin. “Lab administrators can respond to these changes by utilizing technological innovations.”
Other papers will discuss how wireless connectivity and disposable sensors can increase productivity, reduce calibration- and maintenance-related workloads, while increasing system availability and cutting costs. Presenter Chris Campbell of AssetSmart said, “Advances in computing technologies can help metrology professionals increase productivity and efficiency, improve process repeatability and integration by minimizing opportunities for human error, increase internal/external customer satisfaction, achieve and maintain compliance and save money.”
In the presentation, Future Sensor-Based Networks, Randy Rupnow of NSWC Corona Division will discuss how sensors of the future, such as embedded and wireless sensors, must have the ability to support sensors of the past, our current-state technology, as well. “Upfront and early participation in the design and development of technologies will ensure that calibration capabilities are built into the future systems, such as U.S. Navy ships,” said Rupnow. “Any future Department of Defense and Department of Homeland Security initiatives – such as remote system monitoring and control, conditioned-based maintenance, and perimeter security monitoring – will introduce multiple sensors into government security and military weapon systems,” continued Rupnow. Challenges of maintainability and calibration requirements associated with current analog sensor based systems will need to be overcome, and this discussion will explore foreseeable sensor/system attributes from the viewpoint of the end user, maintainer, and metrologist.
Additional program tracks of interest are public responsibility, metrology processes, and education.
Further updates on the workshop schedule, NIST tutorial schedule, technical paper presentations, as well as the latest Conference updates, can all be found by logging on to the website at www.msc-conf.com or calling tollfree 1-866-MSC-MEAS (1-866-672-6327).
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About The Measurement Science Conference
For more than 35 years, the Measurement Science Conference has been a leader in promoting education and professionalism in the measurement science disciplines. The annual conference attracts expert speakers, exhibitors, and attendees from around the world for the weeklong event focused on the dynamic measurement science field.