Example: Memory test with bit level failure. The newly enhanced processor-controlled test (PCT) tool on ASSET® InterTech’s ScanWorks&#...
Richardson, TX (July 9, 2013) – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation...
With the introduction today of Intel® Silicon View Technology (Intel® SVT), ASSET® InterTech’s (www.asset-intertech.com) Sca...
Richardson, TX (Nov. 27, 2012) – A new white paper from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for ...
ASSET ScanWorks\\\' boundary-scan test has been integrated into Teradyne\\\'s Di-Series test instruments for large-scal ATE systems. Richardson, ...
Richardson, TX (June, 2 2011) – In a new whitepaper from ASSET InterTech, Al Couch, ASSET’s chief technologist for core instrumentati...
Richardson, TX (March 1, 2011) - ASSET®, with its ScanWorks® platform for embedded instruments, is the first tools provider to launch t...
Richardson, TX (Sept. 14, 2010) – A new toolkit for ASSET’s ScanWorks® platform for embedded instruments will allow memory suppl...
Richardson, TX (Aug. 4, 2009) – The new Dispatcher for ASSET® InterTech’s ScanWorks® platform for embedded instrumentation ...
Richardson, TX (Jan. 20, 2009) – The new ScanWorks® for Embedded Boundary Scan from ASSET® InterTech (www.asset-intertech.com), t...