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  Industry News  Reusable Design Patterns for High-Performance Distributed Systems Live Event: August 11, 2011 (11:00 a.m. EDT/8:00 a.m. PT/4:00 p.m. GMT) Real-Time Innovations participate in OpenSystems Media’s E-cast
Industry News

Reusable Design Patterns for High-Performance Distributed Systems Live Event: August 11, 2011 (11:00 a.m. EDT/8:00 a.m. PT/4:00 p.m. GMT) Real-Time Innovations participate in OpenSystems Media’s E-cast

Real-Time Innovations (RTI)Real-Time Innovations (RTI)—August 5, 20110
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Real-Time Innovations (RTI) messaging software with its configurable Quality of Service (QoS) accommodates these unique design patterns. It allows system architects to provide a customized infrastructure with an off-the-shelf standardized solution. The net result is a reduction in cost and risk for all phases (development, integration, and deployment) of your project.

This webinar will explore some of the reusable design patterns that are easily achievable with RTI’s solution.

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RTI will be available for a Q&A session immediately following the E-cast.

• Who: Curt Schwaderer, Technical Editor, OpenSystems Media (E-cast Moderator) and Bert Farabaugh, Worldwide Field Applications Engineering Manager, RTI

• What: Industry expert from RTI presents a live OpenSystems Media E-cast, “Reusable Design Patterns for High-Performance Distributed Systems”

• When: Thursday, August 11, 2011 at 11:00 a.m. EDT/8:00 a.m. PT/4:00 p.m. GMT

• Where: To attend the E-cast, participants can register at ecast.opensystemsmedia.com/

OpenSystems Media has been a leading publisher of electronics magazines, e-mail newsletters, websites, and product resource guides for more than 20 years. OpenSystems Media offers E-casts and Techcasts for engineers and provides interactive tools where engineers can communicate directly with presenters and top industry editors. Current publications include: CompactPCI, AdvancedTCA, & MicroTCA Systems; DSP-FPGA.com; Embedded Computing Design; Industrial Embedded Systems; Military Embedded Systems; PC/104 and Small Form Factors; and VME and Critical Systems. For more information, visit www.opensystemsmedia.com.

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